Spectroscopic ellipsometry in the infrared and ultraviolet spectral region for the study of inorganic and organic nanostructured materials

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DOI
10.12681/eadd/19080
Handle URL
http://hdl.handle.net/10442/hedi/19080
ND
19080
Alternative title
Φασματοσκοπική ελλειψομετρία υπέρυθρου και υπεριώδους στην μελέτη ανόργανων και οργανικών νανοδομικών υλικών
Author
Laskarakis, Argirios (Father's name: Vasileios)
Date
2005
Degree Grantor
Aristotle University Of Thessaloniki (AUTH)
Committee members
Λογοθετίδης Στέργιος
Φράγκης Νικόλαος
Κανελλής Γεώργιος
Βες Σωτήριος
Παναγιώτου Κωνσταντίνος
Κουρούκλης Γεράσιμος
Πατσαλάς Παναγιώτης
Discipline
Natural Sciences
Physical Sciences
Keywords
Spectroscopic ellipsometry; Nanostructured materials; Polymer; Carbon nitride; Boron nitride; Infrared; Ultraviolet; Nanotechnology; Nanoscience
Country
Greece
Language
Greek
Description
234 σ., im.
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